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Multi-Instrument - Device Test Plan
Multi-Instrument - Device Test Plan
Specifications

1. Provides a mechanism for you to configure and conduct your own device test steps. It takes the advantage of the sound card’s (or other ADC/DAC hardware’s) capability of simultaneous input & output, to generate a stimulus to the Device Under Test (DUT) and acquire the response from that device at the same time. Different stimuli can be generated and the response can be analyzed in different ways.

2. Supports 14 instructions with corresponding parameters.

3. Parameters to be tested can be selected from 151 DDPs and 16 UDDPs, including RMS value, Peak Frequency, Sound Pressure Level, RPM, Gain, THD, etc.

4. Test results (e.g. Gain vs Frequency, Phase vs Frequency, etc.) can be plotted in up to 8 X-Y plots and reported in one textual log window in real time.

5. Support batch file processing and batch signal event capturing and storing.

6. A device test plan can be created, edited, modified, saved, locked, reloaded, executed.

7. There are two types of device test plans: locked and unlocked. A locked device test plan cannot be modified within the software after it has been created.

8. Support Pass/Fail check.

9. Supports Multilingual User Interface under Windows 2000, XP, 2003, Vista, 7, 8 and above. Currently supported languages are English, French, German, Italian, Portuguese, Spanish, Russian, Simplified Chinese, Traditional Chinese, Japanese and Korean.

Examples

Multi-Instrument Device Test Plan Pass Fail Test
Pass / Fail test
Multi-Instrument Device Test Plan Gain and Phase Plot
Gain and Phase Plot using stepped sine
Multi-Instrument Device Test Plan THD, THD+N, SNR, Magnitude Response vs Frequency
THD, THD+N, SNR, Magnitude Response vs Frequency
Multi-Instrument Device Test Plan Crosstalk vs Frequency
Crosstalk vs Frequency
Multi-Instrument Device Test Plan THD and THD+N vs Magnitude and Power
THD and THD+N vs Magnitude and Power
Multi-Instrument Device Test Plan IMD vs Magnitude and Power
IMD vs Magnitude and Power

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